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Near Field Scanning Thermal Microscopy: The Oldenburg Project

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Uli F. Wischnath et.al.: The near-field scanning thermal microscope

Author(s): Uli F. Wischnath, Joachim Welker, Marco Munzel, Achim Kittel

Title: The near-field scanning thermal microscope

Article: Rev. Sci. Instrum. 79, 073708 (2008), American Institute of Physics

Keywords: NSThM, near-field scanning thermal microscope, near-field

PACS: 07.20.Dt, 42.79.Pw, 07.79.Cz

Abstract:
We report on the design, characterization, and performance of a near-field scanning thermal microscope capable to detect thermal heat currents mediated by evanescent thermal electromagnetic fields close to the surface of a sample. The instrument operates in ultrahigh vacuum and retains its scanning tunneling microscope functionality, so that its miniature, micropipette-based thermocouple sensor can be positioned with high accuracy. Heat currents on the order of 10−7 W are registered in z spectroscopy at distances from the sample ranging from 1 to about 30 nm. In addition, the device provides detailed thermographic images of a sample's surface.


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Last modified: Nov 13 2008